NSN 5962-01-304-4400, (5962013044400) - Microcircuit Memory Parts List
Microcircuit Memory parts under NSN 5962-01-304-4400 manufactured by Drs Sustainment Systems Inc, Global Associates Ltd, Integrated Device Technology Inc, Texas Instruments Incorporated, White Electronic Designs Corp. All NSN items provided by NSN Parts Hub are compliant with fit, form, and functionality according to parameters set by the DLA. With over 3 billion new and obsolete parts in our searchable database, you can find your required part number of NSN 5962-01-304-4400 with ease when you use NSN Parts Hub as your purchasing partner. We maintain an unmatched supply-chain network with trusted MFRs and verified PMAs and are the only distributor with a No China Sourcing pledge. Do you require part numbers other than ES5447-02, 28105283, IDT71256S85DB, SMJ68CE256-55M, EDH8832C-70KMHR? Related NSN parts are listed below for your convenience.
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| Alternative NSN: 5962013044400 |
| Item Name: Microcircuit Memory |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 013044400 |
| NCB Code: USA (01) |
| Manufacturers: Drs Sustainment Systems Inc , Global Associates Ltd , Integrated Device Technology Inc , Texas Instruments Incorporated , White Electronic Designs Corp |
| Part No | Manufacturer | Item Name | QTY | RFQ |
|---|---|---|---|---|
| ES5447-02 | drs sustainment systems inc | microcircuit memory | Avl | RFQ |
| 28105283 | global associates ltd | microcircuit memory | Avl | RFQ |
| IDT71256S85DB | integrated device technology inc | microcircuit memory | Avl | RFQ |
| SMJ68CE256-55M | texas instruments incorporated | microcircuit memory | Avl | RFQ |
| EDH8832C-70KMHR | white electronic designs corp | microcircuit memory | Avl | RFQ |
Characteristics Data of NSN 5962013044400
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAQ | BODY LENGTH | 1.400 INCHES NOMINAL |
| ADAT | BODY WIDTH | 0.594 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.280 INCHES MAXIMUM |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 1.0 WATTS |
| AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND STATIC OPERATION AND HIGH SPEED |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 26 INPUT |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| CZEQ | TIME RATING PER CHACTERISTIC | 85.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 85.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CZER | MEMORY DEVICE TYPE | RAM |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
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