NSN 5962-01-281-5606, (5962012815606) - Microcircuit Memory Parts List
Microcircuit Memory parts under NSN 5962-01-281-5606 manufactured by Stmicroelectronics Ltd, Raytheon Company, Intel, Dla Land And Maritime. All NSN items provided by NSN Parts Hub are compliant with fit, form, and functionality according to parameters set by the DLA. With over 3 billion new and obsolete parts in our searchable database, you can find your required part number of NSN 5962-01-281-5606 with ease when you use NSN Parts Hub as your purchasing partner. We maintain an unmatched supply-chain network with trusted MFRs and verified PMAs and are the only distributor with a No China Sourcing pledge. Do you require part numbers other than MKB2716T-8, 646112-9022, 616483, M2716, ROM PROM FAMILY 020? Related NSN parts are listed below for your convenience.
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| Alternative NSN: 5962012815606 |
| Item Name: Microcircuit Memory |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 012815606 |
| NCB Code: USA (01) |
| Manufacturers: Dla Land And Maritime , Intel , Raytheon Company , Stmicroelectronics Ltd |
| Part No | Manufacturer | Item Name | QTY | RFQ |
|---|---|---|---|---|
| MKB2716T-8 | stmicroelectronics ltd | microcircuit memory | Avl | RFQ |
| 646112-9022 | raytheon company | microcircuit memory | Avl | RFQ |
| 616483 | raytheon company | microcircuit memory | Avl | RFQ |
| M2716 | intel | microcircuit memory | Avl | RFQ |
| ROM PROM FAMILY 020 | dla land and maritime | microcircuit memory | Avl | RFQ |
Characteristics Data of NSN 5962012815606
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAQ | BODY LENGTH | 1.130 INCHES MINIMUM AND 1.260 INCHES MAXIMUM |
| ADAT | BODY WIDTH | 0.475 INCHES MINIMUM AND 0.530 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.160 INCHES MAXIMUM |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 525.0 MILLIWATTS |
| AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | -65.0 TO 125.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | ELECTROSTATIC SENSITIVE AND W/ENABLE AND HERMETICALLY SEALED AND ULTRAVIOLET ERASABLE AND PROGRAMMABLE |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | METAL OXIDE-SEMICONDUCTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 14 INPUT |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 26.5 VOLTS MAXIMUM POWER SOURCE |
| CZEQ | TIME RATING PER CHACTERISTIC | 450.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 450.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CZER | MEMORY DEVICE TYPE | ROM |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| TTQY | TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
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