NSN 5962-01-158-5202, (5962011585202) - Microcircuit Memory Parts List
Microcircuit Memory parts under NSN 5962-01-158-5202 manufactured by Fluke Corporation, Integrated Device Technology Inc, Nec Electronics Usa Inc, Telephonics Corporation. All NSN items provided by NSN Parts Hub are compliant with fit, form, and functionality according to parameters set by the DLA. With over 3 billion new and obsolete parts in our searchable database, you can find your required part number of NSN 5962-01-158-5202 with ease when you use NSN Parts Hub as your purchasing partner. We maintain an unmatched supply-chain network with trusted MFRs and verified PMAs and are the only distributor with a No China Sourcing pledge. Do you require part numbers other than 647222, IDT-6116S-150CB, UPD446D-3, UPD446C-3, M235A782-1? Related NSN parts are listed below for your convenience.
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| Alternative NSN: 5962011585202 |
| Item Name: Microcircuit Memory |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 011585202 |
| NCB Code: USA (01) |
| Manufacturers: Fluke Corporation , Integrated Device Technology Inc , Nec Electronics Usa Inc , Telephonics Corporation |
| Part No | Manufacturer | Item Name | QTY | RFQ |
|---|---|---|---|---|
| 647222 | fluke corporation | microcircuit memory | Avl | RFQ |
| IDT-6116S-150CB | integrated device technology inc | microcircuit memory | Avl | RFQ |
| UPD446D-3 | nec electronics usa inc | microcircuit memory | Avl | RFQ |
| UPD446C-3 | nec electronics usa inc | microcircuit memory | Avl | RFQ |
| M235A782-1 | telephonics corporation | microcircuit memory | Avl | RFQ |
Characteristics Data of NSN 5962011585202
| MRC | Criteria | Characteristic |
|---|---|---|
| AEHX | MAXIMUM POWER DISSIPATION RATING | 550.0 MILLIWATTS |
| AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | STATIC OPERATION AND HIGH SPEED AND ASYNCHRONOUS |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 14 INPUT |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 5.0 VOLTS MAXIMUM POWER SOURCE |
| CZEQ | TIME RATING PER CHACTERISTIC | 150.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |
| CZER | MEMORY DEVICE TYPE | RAM |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| TTQY | TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
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