NSN 5962-01-102-3575, (5962011023575) - Microcircuit Memory Parts List
Microcircuit Memory parts under NSN 5962-01-102-3575 manufactured by Fairchild Semiconductor Ltd, Freescale Semiconductor Inc, Gould Inc, National Semiconductor Corp, Texas Instruments Incorporated. All NSN items provided by NSN Parts Hub are compliant with fit, form, and functionality according to parameters set by the DLA. With over 3 billion new and obsolete parts in our searchable database, you can find your required part number of NSN 5962-01-102-3575 with ease when you use NSN Parts Hub as your purchasing partner. We maintain an unmatched supply-chain network with trusted MFRs and verified PMAs and are the only distributor with a No China Sourcing pledge. Do you require part numbers other than 2708DC, MCM2708C, ES52SPL-70P08, MM2708Q, TMS2708JL? Related NSN parts are listed below for your convenience.
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| Alternative NSN: 5962011023575 |
| Item Name: Microcircuit Memory |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 011023575 |
| NCB Code: USA (01) |
| Manufacturers: Fairchild Semiconductor Ltd , Freescale Semiconductor Inc , Gould Inc , National Semiconductor Corp , Texas Instruments Incorporated |
| Part No | Manufacturer | Item Name | QTY | RFQ |
|---|---|---|---|---|
| 2708DC | fairchild semiconductor ltd | microcircuit memory | Avl | RFQ |
| MCM2708C | freescale semiconductor inc | microcircuit memory | Avl | RFQ |
| ES52SPL-70P08 | gould inc | microcircuit memory | Avl | RFQ |
| MM2708Q | national semiconductor corp | microcircuit memory | Avl | RFQ |
| TMS2708JL | texas instruments incorporated | microcircuit memory | Avl | RFQ |
Characteristics Data of NSN 5962011023575
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAQ | BODY LENGTH | 1.290 INCHES MAXIMUM |
| ADAT | BODY WIDTH | 0.600 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.205 INCHES MAXIMUM |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 800.0 MILLIWATTS |
| AFGA | OPERATING TEMP RANGE | +0.0 TO 70.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | BURN IN AND ELECTROSTATIC SENSITIVE AND HERMETICALLY SEALED AND PROGRAMMABLE AND STATIC OPERATION AND ULTRAVIOLET ERASABLE AND 3-STATE OUTPUT |
| CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | METAL OXIDE-SEMICONDUCTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 11 INPUT |
| CRHL | BIT QUANTITY | 8192 |
| CSWJ | WORD QUANTITY | 1024 |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 15.0 VOLTS MAXIMUM POWER SOURCE |
| CZER | MEMORY DEVICE TYPE | ROM |
| TEST | TEST DATA DOCUMENT | 57230-ES01BIN-0001 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| TTQY | TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
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