NSN 5961-01-092-9308, (5961010929308) - Semiconductor Devic Parts List
Semiconductor Devic parts under NSN 5961-01-092-9308 manufactured by Astronics Test Systems Inc, Avago Technologies Us Inc, Fluke Corporation, Hewlett Packard Inc, Rohde And Schwarz Usa Inc. All NSN items provided by NSN Parts Hub are compliant with fit, form, and functionality according to parameters set by the DLA. With over 3 billion new and obsolete parts in our searchable database, you can find your required part number of NSN 5961-01-092-9308 with ease when you use NSN Parts Hub as your purchasing partner. We maintain an unmatched supply-chain network with trusted MFRs and verified PMAs and are the only distributor with a No China Sourcing pledge. Do you require part numbers other than 22-1058, 5082-3379, 4807-402776, HP5082-3379, AE 397.0049? Related NSN parts are listed below for your convenience.
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Alternative NSN: 5961010929308 |
Item Name: Semiconductor Devic |
Federal Supply Class (FSC): 5961 Semiconductor Devices and Associated Hardware |
NIIN: 010929308 |
NCB Code: USA (01) |
Manufacturers: Astronics Test Systems Inc , Avago Technologies Us Inc , Fluke Corporation , Hewlett Packard Inc , Rohde And Schwarz Usa Inc |
Part No | Manufacturer | Item Name | QTY | RFQ |
---|---|---|---|---|
22-1058 | astronics test systems inc | semiconductor devic | Avl | RFQ |
5082-3379 | avago technologies us inc | semiconductor devic | Avl | RFQ |
4807-402776 | fluke corporation | semiconductor devic | Avl | RFQ |
HP5082-3379 | hewlett packard inc | semiconductor devic | Avl | RFQ |
5082-3379 | hewlett packard inc | semiconductor devic | Avl | RFQ |
AE 397.0049 | rohde and schwarz usa inc | semiconductor devic | Avl | RFQ |
Characteristics Data of NSN 5961010929308
MRC | Criteria | Characteristic |
---|---|---|
ABBH | INCLOSURE MATERIAL | GLASS |
ABHP | OVERALL LENGTH | 0.150 INCHES MINIMUM AND 0.170 INCHES MAXIMUM |
ABJT | TERMINAL LENGTH | 1.000 INCHES MINIMUM |
ADAV | OVERALL DIAMETER | 0.068 INCHES MINIMUM AND 0.076 INCHES MAXIMUM |
AXGY | MOUNTING METHOD | TERMINAL |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 50.0 MINIMUM BREAKDOWN VOLTAGE, INSTANTANEOUS |
CTRD | POWER RATING PER CHARACTERISTIC | 250.0 MILLIWATTS SMALL-SIGNAL INPUT POWER, COMMON-COLLECTOR ABSOLUTE |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS JUNCTION |
TTQY | TERMINAL TYPE AND QUANTITY | 2 UNINSULATED WIRE LEAD |
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